General -List of Production or manufacturing Tests on RF and SoC devices

This page list out production or manufacturing tests on RF and SoC devices which include VSWR,return loss,gain,IQ mismatch,IP3,TOI and more.

Parameter LNA PA Mixer Switch Transmitter Receiver
VSWR   X X X   X
Return Loss X X X   X X
Insertion Loss       X   X
Gain X X       X
Gain Flatness   X       X
Isolation X   X X    
Linearity   X        
Noise Figure X X X     X
Dynamic Range   X       X
Power Consumption ex.P1dB X X X X X X
Third Order Intermodulation product (IP3) X X X   X X
Third Order Intercept point (TOI)   X       X
Harmonic distortion   X X     X
Conversion Loss/Gain     X      
Intermodulation distortion     X      
Switching speed       X    
Bandwidth X X     X X
Power Added Efficiency(PAE)   X        
Spurious output   X X     X
RF-LO rejection     X     X
ACPR/ACLR   X     X  
Phase Noise         X X
IQ offset           X
IQ amplitude match           X
IQ phase match           X
Output power         X  
Carrier suppression         X  
Error Vector Magnitude(EVM)         X X


Refer RF measurements tutorial which covers covers measurement of gain, spurious,charmonics,c1dB compression point,cnoise figure,cimage rejection,creturn loss, phase noise, group delay, frequency stability, TOI, AM-PM conversion and more RF device measurements.


Book on Production Testing of RF and System-on-a-Chip Devices for Wireless Communications By Keith B. Schaub & Joe Kelly

RF Test Procedures-LNA,SSPA,Transceiver

RF LNA Test Procedure, how to test LNA
RF SSPA Test Procedure, how to test SSPA
RF Transceiver Test Procedure, how to test transceiver


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AM-PM conversion
Error Vector Magnitude
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Design of RF frequency converter
C band RF Transceiver Design and Development
Production tests on RF and SoC devices
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RF Power Amplifier
RF Mixer basics
rf synthesizer design
Noise figure vs Noise Temperature

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